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The study presents the findings of the effect of ion implantation on pristine Copper Zinc Tin Sulphide (CZTS) thin films. The CZTS films were prepared by utilizing a two-stage process, i.e. e-beam deposition of metal precursors; Cu, Zn, and Sn followed by sulphurization process in the tube furnace at 500°C for 30 min. These samples were further implanted with 150 keV V+ ions utilizing fluences, 1x10^16, 3x10^16, and 1x10^17 ions/cm^2. Fundamental properties that govern the photovoltaic applications, i.e., structural and optical were investigated on pristine and ion-implanted CZTS thin films using XRD, Raman, and UV-VIS techniques. The Raman results highlighted the presence of defects in the CZTS samples. UV-VIS revealed an energy band gap in the 1.83 - 1.45 eV range, and absorption within the UV range.
| Apply for student award at which level: | PhD |
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| Consent on use of personal information: Abstract Submission | Yes, I ACCEPT |
